ICS 31
电子学
共 1,114 项 ISO/IEC 标准 · 合计 18.6 GB · 分 56 页展示
二级分类
IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
现行
31.080 半导体分立器件
2006
27 页
¥2
IEC 62374-1:2010
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
现行
31.080 半导体分立器件
2010
32 页
¥2
IEC 62374:2007
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
现行
31.080 半导体分立器件
2007
43 页
¥3
IEC 62384:2020 RLV
DC or AC supplied electronic controlgear for LED modules - Performance requirements
现行
31.080 半导体分立器件
2020
44 页
¥3
IEC 62391-1:2022
Fixed electric double-layer capacitors for use in electric and electronic equipment - Part 1: Generic specification
现行
31.060 电容器
2022
125 页
¥5
IEC 62391-2-1:2006
Fixed electric double-layer capacitors for use in electronic equipment - Part 2-1: Blank detail specification - Electric double-layer…
现行
31.060 电容器
2006
11 页
¥1
IEC 62391-2:2006
Fixed electric double-layer capacitors for use in electronic equipment - Part 2: Sectional specfication - Electric double layer capacitors…
现行
31.060 电容器
2006
45 页
¥3
IEC 62391-2:2025
Fixed electric double-layer capacitors for use in electronic equipment - Part 2: Sectional specification - Electric double-layer capacitors…
现行
31.060 电容器
2025
57 页
¥3
IEC 62415:2010
Semiconductor devices - Constant current electromigration test
现行
31.080 半导体分立器件
2010
22 页
¥2
IEC 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors
现行
31.080 半导体分立器件
2010
20 页
¥1
IEC 62417:2010
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
现行
31.080 半导体分立器件
2010
16 页
¥1
IEC 62418:2010
Semiconductor devices - Metallization stress void test
现行
31.080 半导体分立器件
2010
34 页
¥2
IEC 62421:2007
Electronics assembly technology - Electronic modules
现行
31.190 电子元器件组件
2007
16 页
¥1
IEC 62433-1:2019/COR1:2020
Corrigendum 1 - EMC IC modelling - Part 1: General modelling framework
现行
31.200 集成电路、微电子学
2019
1 页
¥1
IEC 62433-4:2016
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
现行
31.200 集成电路、微电子学
2016
219 页
¥5
IEC 62433-6:2020
EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling…
现行
31.200 集成电路、微电子学
2020
110 页
¥5
IEC 62435-1:2017
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
现行
31.020 电子元器件综合
2017
65 页
¥5
IEC 62435-2:2017
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
现行
31.020 电子元器件综合
2017
36 页
¥2
IEC 62435-3:2020
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
现行
31.020 电子元器件综合
2020
26 页
¥2
IEC 62435-4:2018
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
现行
31.020 电子元器件综合
2018
20 页
¥1
关于 ICS 31 电子学
ICS 31 是 ICS 分类法中的一级大类，中文名称"电子学"，本站收录该分类下的 ISO 与 IEC 国际标准共 1,114 项，覆盖 14 个二级类目。
这一分类下的标准以电子元器件综合、电阻器、电容器等方向为主。如果只需要其中一两份，可以进入详情页按页数单份购买；如果需要成批使用，整包获取更省事——¥199 可获得该分类全部标准的云盘分享，在云盘页面一键打包下载。
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