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Methods of measurement for DVD players

Fixed electric double-layer capacitors for use in electric and electronic equipment - Part 1: Generic specification

Fixed electric double-layer capacitors for use in electronic equipment - Part 2-1: Blank detail specification - Electric double-layer capacitors for power application - Assessment level EZ

Fixed electric double-layer capacitors for use in electronic equipment - Part 2: Sectional specfication - Electric double layer capacitors for power application

Fixed electric double-layer capacitors for use in electronic equipment - Part 2: Sectional specification - Electric double-layer capacitors for power application

Service diagnostic interface for consumer electronics products and networks - Implementation for ECHONET

Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation

Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects

Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems

Nuclear power plants - Instrumentation and control important to safety - Resistance temperature detectors

Radiation protection instrumentation - Alarming personal radiation devices (PRDs) for the detection of illicit trafficking of radioactive material

Obsolescence management

High density recording format on CD-R/RW disc systems - HD-BURN format

Semiconductor devices - Constant current electromigration test

Semiconductor devices - Hot carrier test on MOS transistors

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Semiconductor devices - Metallization stress void test

Control technology - Rules for the designation of measuring instruments