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Maritime navigation and radiocommunication equipment and systems - Maritime survivor locating devices (man overboard devices) - Minimum requirements, methods of testing and required test results

Predictive maintenance of industrial automation equipment and systems - Part 1: General requirements

Nuclear facilities - Electrical power systems - AC interruptible power supply systems

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation

Binary power generation systems - Part 3-1: Safety requirements - System with less than 500 kW in capacity

Binary power generation systems with capacity less than 100 kW - Performance test methods

Asset Administration Shell for industrial applications - Part 1: Asset Administration Shell structure

Asset Administration Shell for industrial applications - Part 4:Applications of Asset Administration Shell

E-Transporters - Part 1: Terminology and classification

E-Transporters - Part 2-1: Safety requirements and test methods for personal e-Transporters

E-Transporters - Part 3-1: Performance test method for total run time of e-scooters with consideration to environmental conditions of actual use

E-Transporters - Part 3-2: Performance test methods for mobility of cargo e-Transporters

Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors

Flexible organic light emitting diode (OLED) panels for general lighting - Performance requirements

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module

Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment

Test methods for electric cables with rated voltages up to and including 450/750 V