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IEC 60512-13-5:2006
Connectors for electronic equipment - Tests and measurements - Part 13-5: Mechanical operation tests - Test 13e: Polarizing and keying method
现行
ICS 31 电子学
2006
13 页
¥1
IEC 60512-14-2:2006
Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage
现行
ICS 31 电子学
2006
11 页
¥1
IEC 60512-14-4:2006
Connectors for electronic equipment - Tests and measurements - Part 14-4: Sealing tests - Test 14d: Immersion - Waterproof
现行
ICS 31 电子学
2006
9 页
¥1
IEC 60512-14-5:2006
Connectors for electronic equipment - Tests and measurements - Part 14-5: Sealing tests - Test 14e: Immersion at low air pressure
现行
ICS 31 电子学
2006
11 页
¥1
IEC 60512-14-6:2006
Connectors for electronic equipment - Tests and measurements - Part 14-6: Sealing tests - Test 14f: Interfacial sealing
现行
ICS 31 电子学
2006
11 页
¥1
IEC 60512-14-7:1997
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 14: Sealing tests - Section 7: Test 14g: Impacting water
现行
ICS 31 电子学
1997
7 页
¥1
IEC 60512-15-1:2008
Connectors for electronic equipment - Tests and measurements - Part 15-1: Connector tests (mechanical) - Test 15a: Contact retention in insert
现行
ICS 31 电子学
2008
9 页
¥1
IEC 60512-15-2:2018
Connectors for electrical and electronic equipment - Tests and measurements - Part 15-2: Connector tests (mechanical) - Test 15b: Insert retention in housing (axial)
现行
ICS 31 电子学
2018
16 页
¥1
IEC 60512-15-3:2008
Connectors for electronic equipment - Tests and measurements - Part 15-3: Connector tests (mechanical) - Test 15c: Insert retention in housing (torsional)
现行
ICS 31 电子学
2008
12 页
¥1
IEC 60512-15-4:2008
Connectors for electronic equipment - Tests and measurements - Part 15-4: Connector tests (mechanical) - Test 15d: Contact insertion, release and extraction force
现行
ICS 31 电子学
2008
12 页
¥1
IEC 60512-15-5:2008
Connectors for electronic equipment - Tests and measurements - Part 15-5: Connector tests (mechanical) - Test 15e: Contact retention in insert, cable nutation
现行
ICS 31 电子学
2008
13 页
¥1
IEC 60512-15-6:2008
Connectors for electronic equipment - Tests and measurements - Part 15-6: Connector tests (mechanical) - Test 15f: Effectiveness of connector coupling devices
现行
ICS 31 电子学
2008
10 页
¥1
IEC 60512-15-7:2008
Connectors for electronic equipment - Tests and measurements - Part 15-7: Connector tests (mechanical) - Test 15g: Robustness of protective cover attachment
现行
ICS 31 电子学
2008
9 页
¥1
IEC 60512-15-8:1995
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 15: Mechanical tests on contacts and terminations - Section 8: Test 15h - Contact retention system resistance to tool application
现行
ICS 31 电子学
1995
9 页
¥1
IEC 60512-16-11:2008
Connectors for electronic equipment - Tests and measurements - Part 16-11: Mechanical tests on contacts and terminations - Test 16k: Stripping force, solderless wrapped connections
现行
ICS 31 电子学
2008
12 页
¥1
IEC 60512-16-13:2008
Connectors for electronic equipment - Tests and measurements - Part 16-13: Mechanical tests on contacts and terminations - Test 16m: Un-wrapping, solderless wrapped connections
现行
ICS 31 电子学
2008
9 页
¥1
IEC 60512-16-14:2008
Connectors for electronic equipment - Tests and measurements - Part 16-14: Mechanical tests on contacts and terminations - Test 16n: Bending strength, fixed male tabs
现行
ICS 31 电子学
2008
12 页
¥1
IEC 60512-16-16:2008
Connectors for electronic equipment - Tests and measurements - Part 16-16: Mechanical tests on contacts and terminations - Test 16p: Torsional strength, fixed male tabs
现行
ICS 31 电子学
2008
12 页
¥1
IEC 60512-16-17:2008
Connectors for electronic equipment - Tests and measurements - Part 16-17: Mechanical tests on contacts and terminations - Test 16q: Tensile and compressive strength, fixed male tabs
现行
ICS 31 电子学
2008
13 页
¥1
IEC 60512-16-18:2008
Connectors for electronic equipment - Tests and measurements - Part 16-18: Mechanical tests on contacts and terminations - Test 16r: Deflection of contacts, simulation
现行
ICS 31 电子学
2008
12 页
¥1