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IEC 60512-16-1:2008
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
现行
ICS 31 电子学
2008
12 页
¥1
IEC 60512-16-20:1996
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 16: Mechanical tests on contacts and terminations - Section 20: Test 16t: Mechanical strength (wired termination of solderless connections)
现行
ICS 31 电子学
1996
7 页
¥1
IEC 60512-16-21:2012
Connectors for electronic equipment - Tests and measurements - Part 16-21: Mechanical tests on contacts and terminations - Test 16u: Whisker test via the application of external mechanical stresses
现行
ICS 31 电子学
2012
21 页
¥2
IEC 60512-16-2:2008
Connectors for electronic equipment - Tests and measurements - Part 16-2: Mechanical tests on contacts and terminations - Test 16b: Restricted entry
现行
ICS 31 电子学
2008
9 页
¥1
IEC 60512-16-3:2008
Connectors for electronic equipment - Tests and measurements - Part 16-3: Mechanical tests on contacts and terminations - Test 16c: Contact-bending strength
现行
ICS 31 电子学
2008
13 页
¥1
IEC 60512-16-4:2008
Connectors for electronic equipment - Tests and measurements - Part 16-4: Mechanical tests on contacts and terminations - Test 16d: Tensile strength (crimped connections)
现行
ICS 31 电子学
2008
12 页
¥1
IEC 60512-16-5:2008
Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts)
现行
ICS 31 电子学
2008
9 页
¥1
IEC 60512-16-6:2008
Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations
现行
ICS 31 电子学
2008
9 页
¥1
IEC 60512-16-7:2008
Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping
现行
ICS 31 电子学
2008
13 页
¥1
IEC 60512-16-8:2008
Connectors for electronic equipment - Tests and measurements - Part 16-8: Mechanical tests on connections and terminations - Test 16h: Insulating grip effectiveness (crimped connections)
现行
ICS 31 电子学
2008
12 页
¥1
IEC 60512-16-9:2008
Connectors for electronic equipment - Tests and measurements - Part 16-9: Mechanical tests on contacts and terminations - Test 16i: Grounding contact spring holding force
现行
ICS 31 电子学
2008
9 页
¥1
IEC 60512-17-1:2010
Connectors for electronic equipment - Tests and measurements - Part 17-1: Cable clamping tests - Test 17a: Cable clamp robustness
现行
ICS 31 电子学
2010
9 页
¥1
IEC 60512-17-2:2011
Connectors for electronic equipment - Tests and measurements - Part 17-2: Cable clamping tests - Test 17b: Cable clamp resistance to cable rotation
现行
ICS 31 电子学
2011
12 页
¥1
IEC 60512-17-3:2010
Connectors for electronic equipment - Tests and measurements - Part 17-3: Cable clamping tests - Test 17c: Cable clamp resistance to cable pull (tensile)
现行
ICS 31 电子学
2010
9 页
¥1
IEC 60512-17-4:2010
Connectors for electronic equipment - Tests and measurements - Part 17-4: Cable clamping tests - Test 17d: Cable clamp resistance to cable torsion
现行
ICS 31 电子学
2010
9 页
¥1
IEC 60512-19-1:2010
Connectors for electronic equipment - Tests and measurements - Part 19-1: Chemical resistance tests - Test 19a: Fluid resistance of pre-insulated crimp barrels
现行
ICS 31 电子学
2010
9 页
¥1
IEC 60512-19-3:1997
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 19: Chemical resistance tests - Section 3: Test 19c - Fluid resistance
现行
ICS 31 电子学
1997
11 页
¥1
IEC 60512-1:2018
Connectors for electrical and electronic equipment - Tests and measurements - Part 1: Generic specification
现行
ICS 31 电子学
2018
28 页
¥2
IEC 60512-2-2:2003
Connectors for electronic equipment - Tests and measurements - Part 2-2: Electrical continuity and contact resistance tests - Test 2b: Contact resistance - Specified test current method
现行
ICS 31 电子学
2003
9 页
¥1
IEC 60512-2-5:2003
Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance
现行
ICS 31 电子学
2003
7 页
¥1