ICS 31
电子学
共 1,114 项 ISO/IEC 标准 · 合计 18.6 GB · 分 56 页展示
二级分类
IEC 60679-5:1998
Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
现行
31.140 频率控制和选择用压电器件与介…
1998
31 页
¥2
IEC 60689:2008
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
现行
31.140 频率控制和选择用压电器件与介…
2008
37 页
¥2
IEC 60717:2012
Method for the determination of the space required by capacitors and resistors with unidirectional terminations
现行
31.060 电容器
2012
20 页
¥1
IEC 60738-1-1:2008
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-1: Blank detail specification - Current limiting…
现行
31.040 电阻器
2008
28 页
¥2
IEC 60738-1-2:2008
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-2: Blank detail specification - Heating element…
现行
31.040 电阻器
2008
25 页
¥2
IEC 60738-1-3:2008
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current…
现行
31.040 电阻器
2008
25 页
¥2
IEC 60738-1-4:2008
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application -…
现行
31.040 电阻器
2008
25 页
¥2
IEC 60738-1:2022
Thermistors - Directly heated positive temperature coefficient - Part 1: Generic specification
现行
31.040 电阻器
2022
132 页
¥5
IEC 60747-14-10:2019
Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
现行
31.080 半导体分立器件
2019
64 页
¥5
IEC 60747-14-11:2021
Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring…
现行
31.080 半导体分立器件
2021
21 页
¥2
IEC 60747-14-1:2010
Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
现行
31.080 半导体分立器件
2010
42 页
¥3
IEC 60747-14-2:2000
Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
现行
31.080 半导体分立器件
2000
14 页
¥1
IEC 60747-14-3:2009
Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
现行
31.080 半导体分立器件
2009
37 页
¥2
IEC 60747-14-4:2011
Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
现行
31.080 半导体分立器件
2011
197 页
¥5
IEC 60747-14-5:2010
Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
现行
31.080 半导体分立器件
2010
37 页
¥2
IEC 60747-15:2024 RLV
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
现行
31.080 半导体分立器件
2024
176 页
¥5
IEC 60747-16-10:2004
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
现行
31.200 集成电路、微电子学
2004
56 页
¥3
IEC 60747-16-11:2026
Semiconductor devices - Part 16-11: Microwave integrated circuits - Power detectors
现行
31.080 半导体分立器件
2026
36 页
¥2
IEC 60747-16-5:2013/AMD1:2020/COR1:2020
Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
现行
31.080 半导体分立器件
2013
1 页
¥1
IEC 60747-16-6:2019
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
现行
31.080 半导体分立器件
2019
50 页
¥3
关于 ICS 31 电子学
ICS 31 是 ICS 分类法中的一级大类，中文名称"电子学"，本站收录该分类下的 ISO 与 IEC 国际标准共 1,114 项，覆盖 14 个二级类目。
这一分类下的标准以电子元器件综合、电阻器、电容器等方向为主。如果只需要其中一两份，可以进入详情页按页数单份购买；如果需要成批使用，整包获取更省事——¥199 可获得该分类全部标准的云盘分享，在云盘页面一键打包下载。
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