ICS 31
电子学
共 1,114 项 ISO/IEC 标准 · 合计 18.6 GB · 分 56 页展示
二级分类
IEC 60747-16-7:2022
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
现行
31.080 半导体分立器件
2022
83 页
¥5
IEC 60747-16-8:2022
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
现行
31.080 半导体分立器件
2022
73 页
¥5
IEC 60747-17:2020/COR1:2021
Corrigendum 1 - Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
现行
31.080 半导体分立器件
2020
1 页
¥1
IEC 60747-18-1:2019
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic…
现行
31.080 半导体分立器件
2019
26 页
¥2
IEC 60747-18-2:2020
Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
现行
31.080 半导体分立器件
2020
18 页
¥1
IEC 60747-18-3:2019
Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package…
现行
31.080 半导体分立器件
2019
22 页
¥2
IEC 60747-18-4:2023
Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array…
现行
31.080 半导体分立器件
2023
14 页
¥1
IEC 60747-18-5:2023
Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS…
现行
31.080 半导体分立器件
2023
12 页
¥1
IEC 60747-19-1:2019
Semiconductor devices – Part 19-1: Smart sensors – Control scheme of smart sensors
现行
31.080 半导体分立器件
2019
21 页
¥2
IEC 60747-2-2:1993
Semiconductor devices - Discrete devices - Part 2: Rectifier diodes - Section 2: Blank detail specification for rectifier diodes (including…
被代替
31.080 半导体分立器件
1993
31 页
¥2
IEC 60747-2:2016
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
现行
31.080 半导体分立器件
2016
91 页
¥5
IEC 60747-2:2025
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
现行
31.080 半导体分立器件
2025
50 页
¥3
IEC 60747-3:2013
Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes
现行
31.080 半导体分立器件
2013
69 页
¥5
IEC 60747-5-10:2019
Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on…
现行
31.080 半导体分立器件
2019
16 页
¥1
IEC 60747-5-11:2019
Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of…
现行
31.080 半导体分立器件
2019
13 页
¥1
IEC 60747-5-13:2021
Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
现行
31.080 半导体分立器件
2021
19 页
¥1
IEC 60747-5-14:2022
Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the…
现行
31.080 半导体分立器件
2022
21 页
¥2
IEC 60747-5-15:2022
Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the…
现行
31.080 半导体分立器件
2022
14 页
¥1
IEC 60747-5-16:2023
Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light…
现行
31.080 半导体分立器件
2023
17 页
¥1
IEC 60747-5-18:2026
Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for…
现行
31.080 半导体分立器件
2026
17 页
¥1
关于 ICS 31 电子学
ICS 31 是 ICS 分类法中的一级大类，中文名称"电子学"，本站收录该分类下的 ISO 与 IEC 国际标准共 1,114 项，覆盖 14 个二级类目。
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