ICS 31
电子学
共 1,114 项 ISO/IEC 标准 · 合计 18.6 GB · 分 56 页展示
二级分类
IEC 60749-39:2021
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic…
现行
31.080 半导体分立器件
2021
25 页
¥2
IEC 60749-3:2017
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
现行
31.080 半导体分立器件
2017
11 页
¥1
IEC 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
现行
31.080 半导体分立器件
2011
44 页
¥3
IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
现行
31.080 半导体分立器件
2020
44 页
¥3
IEC 60749-42:2014
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
现行
31.080 半导体分立器件
2014
16 页
¥1
IEC 60749-43:2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
被代替
31.080 半导体分立器件
2017
74 页
¥5
IEC 60749-44:2016
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for…
现行
31.080 半导体分立器件
2016
41 页
¥3
IEC 60749-4:2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
现行
31.080 半导体分立器件
2017
9 页
¥1
IEC 60749-5:2023
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
现行
31.080 半导体分立器件
2023
17 页
¥1
IEC 60749-6:2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
现行
31.080 半导体分立器件
2017
8 页
¥1
IEC 60749-7:2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other…
现行
31.080 半导体分立器件
2011
21 页
¥2
IEC 60749-7:2025
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other…
现行
31.080 半导体分立器件
2025
24 页
¥2
IEC 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
现行
31.080 半导体分立器件
2017
9 页
¥1
IEC 60749:1996
Semiconductor devices - Mechanical and climatic test methods
被代替
31.080 半导体分立器件
1996
95 页
¥5
IEC 60758:2016
Synthetic quartz crystal - Specifications and guidelines for use
现行
31.140 频率控制和选择用压电器件与介…
2016
60 页
¥3
IEC 60807-1:1991
Rectangular connectors for frequencies below 3 MHz - Part 1:
Generic specification - General requirements and guide for the
preparation of…
现行
31.220 电子电信设备用机电元件
1991
68 页
¥5
IEC 60807-3:1990
Rectangular connectors for frequencies below 3 MHz. Part 3: Detail specification for a range of connectors with trapezoidal shaped metal…
现行
31.220 电子电信设备用机电元件
1990
57 页
¥3
IEC 60807-6:1988
Rectangular connectors for frequencies below 3 MHz. Part 6: Detail specification for a range of rectangular connectors with size 20 (7.5 A)…
现行
31.220 电子电信设备用机电元件
1988
59 页
¥3
IEC 60807-8:1992
Rectangular connectors for frequencies below 3 MHz - Part 8: Detail specification for connectors, four-signal contacts and earthing…
现行
31.220 电子电信设备用机电元件
1992
91 页
¥5
IEC 60825-12:2022/COR1:2024
Corrigendum 1 - Safety of laser products - Part 12: Safety of free space optical communication systems used for transmission of information
现行
31.260 光电子学、激光设备
2022
4 页
¥1
关于 ICS 31 电子学
ICS 31 是 ICS 分类法中的一级大类，中文名称"电子学"，本站收录该分类下的 ISO 与 IEC 国际标准共 1,114 项，覆盖 14 个二级类目。
这一分类下的标准以电子元器件综合、电阻器、电容器等方向为主。如果只需要其中一两份，可以进入详情页按页数单份购买；如果需要成批使用，整包获取更省事——¥199 可获得该分类全部标准的云盘分享，在云盘页面一键打包下载。
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