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IEC 62047-46:2025
Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication technology - Measurement method of tensile strength of nanoscale thickness membrane
现行
ICS 31 电子学
2025
15 页
¥1
IEC 62047-47:2024
Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures
现行
ICS 31 电子学
2024
16 页
¥1
IEC 62047-48:2024
Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device
现行
ICS 31 电子学
2024
16 页
¥1
IEC 62047-49:2025
Semiconductor devices - Micro-electromechanical devices - Part 49: Temperature and humidity test methods for piezoelectric MEMS cantilevers
现行
ICS 31 电子学
2025
8 页
¥1
IEC 62047-4:2008
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
现行
ICS 31 电子学
2008
38 页
¥2
IEC 62047-4:2026 RLV
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
现行
ICS 31 电子学
2026
39 页
¥2
IEC 62047-50:2025
Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
现行
ICS 31 电子学
2025
13 页
¥1
IEC 62047-52:2026
Semiconductor devices - Micro-electromechanical devices - Part 52: Biaxial tensile testing method for stretchable MEMS
现行
ICS 31 电子学
2026
12 页
¥1
IEC 62047-53:2025
Semiconductor devices - Micro-electromechanical devices - Part 53: MEMS electrothermal transfer device
现行
ICS 31 电子学
2025
14 页
¥1
IEC 62047-6:2009
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
现行
ICS 31 电子学
2009
30 页
¥2
IEC 62047-7:2011
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
现行
ICS 31 电子学
2011
56 页
¥3
IEC 62047-8:2011
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
现行
ICS 31 电子学
2011
36 页
¥2
IEC 62052-11:2020
Electricity metering equipment - General requirements, tests and test conditions - Part 11: Metering equipment
现行
ICS 17 计量学和测量、物理现象
2020
119 页
¥5
IEC 62052-31:2015/ISH1:2019
Interpretation Sheet 1 - Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 31: Product safety requirements and tests
现行
ICS 91 建筑材料和建筑物
2015
5 页
¥1
IEC 62052-41:2022
Electricity metering equipment - General requirements, tests and test conditions - Part 41: Energy registration methods and requirements for multi-energy and multi-rate meters
现行
ICS 17 计量学和测量、物理现象
2022
47 页
¥3
IEC 62053-21:2020
Electricity metering equipment - Particular requirements - Part 21: Static meters for AC active energy (classes 0,5, 1 and 2)
现行
ICS 17 计量学和测量、物理现象
2020
33 页
¥2
IEC 62053-22:2020
Electricity metering equipment - Particular requirements - Part 22: Static meters for AC active energy (classes 0,1S, 0,2S and 0,5S)
现行
ICS 17 计量学和测量、物理现象
2020
34 页
¥2
IEC 62053-23:2020
Electricity metering equipment - Particular requirements - Part 23: Static meters for reactive energy (classes 2 and 3)
现行
ICS 17 计量学和测量、物理现象
2020
33 页
¥2
IEC 62053-24:2020
Electricity metering equipment - Particular requirements - Part 24: Static meters for fundamental component reactive energy (classes 0,5S, 1S, 1, 2 and 3)
现行
ICS 91 建筑材料和建筑物
2020
46 页
¥3
IEC 62053-41:2021
Electricity metering equipment - Particular requirements - Part 41: Static meters for DC energy (classes 0,5 and 1)
现行
ICS 17 计量学和测量、物理现象
2021
32 页
¥2