ICS 31
电子学
共 1,114 项 ISO/IEC 标准 · 合计 18.6 GB · 分 56 页展示
二级分类
IEC 62047-46:2025
Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication technology - Measurement method of…
现行
31.080 半导体分立器件
2025
15 页
¥1
IEC 62047-47:2024
Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of…
现行
31.080 半导体分立器件
2024
16 页
¥1
IEC 62047-48:2024
Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption…
现行
31.080 半导体分立器件
2024
16 页
¥1
IEC 62047-49:2025
Semiconductor devices - Micro-electromechanical devices - Part 49: Temperature and humidity test methods for piezoelectric MEMS cantilevers
现行
31.080 半导体分立器件
2025
8 页
¥1
IEC 62047-4:2008
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
现行
31.080 半导体分立器件
2008
38 页
¥2
IEC 62047-4:2026 RLV
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
现行
31.080 半导体分立器件
2026
39 页
¥2
IEC 62047-50:2025
Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
现行
31.080 半导体分立器件
2025
13 页
¥1
IEC 62047-52:2026
Semiconductor devices - Micro-electromechanical devices - Part 52: Biaxial tensile testing method for stretchable MEMS
现行
31.080 半导体分立器件
2026
12 页
¥1
IEC 62047-53:2025
Semiconductor devices - Micro-electromechanical devices - Part 53: MEMS electrothermal transfer device
现行
31.080 半导体分立器件
2025
14 页
¥1
IEC 62047-6:2009
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
现行
31.080 半导体分立器件
2009
30 页
¥2
IEC 62047-7:2011
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
现行
31.080 半导体分立器件
2011
56 页
¥3
IEC 62047-8:2011
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
现行
31.080 半导体分立器件
2011
36 页
¥2
IEC 62090:2017
Product package labels for electronic components using bar code and two-dimensional symbologies
现行
31.190 电子元器件组件
2017
31 页
¥2
IEC 62132-1:2015
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
现行
31.200 集成电路、微电子学
2015
49 页
¥3
IEC 62132-2:2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell…
现行
31.200 集成电路、微电子学
2010
49 页
¥3
IEC 62132-4:2006
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
现行
31.200 集成电路、微电子学
2006
49 页
¥3
IEC 62132-5:2005
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
现行
31.200 集成电路、微电子学
2005
45 页
¥3
IEC 62132-8:2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
现行
31.200 集成电路、微电子学
2012
46 页
¥3
IEC 62132-8:2026
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
现行
31.200 集成电路、微电子学
2026
44 页
¥3
IEC 62137-1-1:2007
Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-1: Pull strength test
现行
31.190 电子元器件组件
2007
15 页
¥1
关于 ICS 31 电子学
ICS 31 是 ICS 分类法中的一级大类，中文名称"电子学"，本站收录该分类下的 ISO 与 IEC 国际标准共 1,114 项，覆盖 14 个二级类目。
这一分类下的标准以电子元器件综合、电阻器、电容器等方向为主。如果只需要其中一两份，可以进入详情页按页数单份购买；如果需要成批使用，整包获取更省事——¥199 可获得该分类全部标准的云盘分享，在云盘页面一键打包下载。
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