ICS 31
电子学
共 1,114 项 ISO/IEC 标准 · 合计 18.6 GB · 分 56 页展示
二级分类
IEC 63207:2022
Measurement methods of blue light characteristics and related optical performance for visual display terminals
现行
31.120 电子显示器件
2022
28 页
¥2
IEC 63211-2-21:2025
Durability test methods for electronic displays - Part 2-21: Environmental tests - Test methods for heat and humidity
现行
31.120 电子显示器件
2025
23 页
¥2
IEC 63211-2-23:2025
Durability test methods for electronic displays - Part 2-23: Environmental tests - Outdoor weathering
现行
31.120 电子显示器件
2025
16 页
¥1
IEC 63211-3-2:2025
Durability test methods for electronic displays - Part 3-2: Mechanical tests - Static stress
现行
31.120 电子显示器件
2025
21 页
¥2
IEC 63211-3-5:2020
Durability test methods for electronic displays - Part 3-5: Mechanical tests - Surface durability
现行
31.120 电子显示器件
2020
18 页
¥1
IEC 63215-2:2023
Endurance test methods for die attach materials - Part 2: Temperature cycling test method for die attach materials applied to discrete type…
现行
31.190 电子元器件组件
2023
46 页
¥3
IEC 63229:2021
Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
现行
31.080 半导体分立器件
2021
21 页
¥2
IEC 63244-1:2021
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
现行
31.080 半导体分立器件
2021
65 页
¥5
IEC 63251:2023
Test method for mechanical properties of flexible opto-electric circuit boards under thermal stress
现行
31.180 印制电路和印制电路板
2023
42 页
¥3
IEC 63275-1:2022
Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1:…
现行
31.080 半导体分立器件
2022
25 页
¥2
IEC 63275-2:2022
Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2:…
现行
31.080 半导体分立器件
2022
20 页
¥1
IEC 63284:2022
Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
现行
31.080 半导体分立器件
2022
25 页
¥2
IEC 63287-1:2021
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
现行
31.080 半导体分立器件
2021
86 页
¥5
IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
现行
31.080 半导体分立器件
2023
30 页
¥2
IEC 63287-3:2026
Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power…
现行
31.080 半导体分立器件
2026
68 页
¥5
IEC 63287-4:2026
Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
现行
31.080 半导体分立器件
2026
30 页
¥2
IEC 63364-1:2022
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
现行
31.080 半导体分立器件
2022
24 页
¥2
IEC 63373:2022
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
现行
31.080 半导体分立器件
2022
28 页
¥2
IEC 63378-2-1:2024
Thermal standardization on semiconductor packages - Part 2-1: 3D thermal simulation models of semiconductor packages for steady-state…
现行
31.080 半导体分立器件
2024
15 页
¥1
IEC 63378-3:2025
Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for…
现行
31.080 半导体分立器件
2025
29 页
¥2
关于 ICS 31 电子学
ICS 31 是 ICS 分类法中的一级大类，中文名称"电子学"，本站收录该分类下的 ISO 与 IEC 国际标准共 1,114 项，覆盖 14 个二级类目。
这一分类下的标准以电子元器件综合、电阻器、电容器等方向为主。如果只需要其中一两份，可以进入详情页按页数单份购买；如果需要成批使用，整包获取更省事——¥199 可获得该分类全部标准的云盘分享，在云盘页面一键打包下载。
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